SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION

J. Giraldi, M. Bushnell
{"title":"SEARCH STATE EQUIVALENCE FOR REDUNDANCY IDENTIFICATION AND TEST GENERATION","authors":"J. Giraldi, M. Bushnell","doi":"10.1109/TEST.1991.519509","DOIUrl":null,"url":null,"abstract":"We present new extensions to the EST' algoritlm, which accelerates combinational circuit Redundancy Identification and Automatic Test Pattern Generation (ATPG) algorithms, in particular SOCRATES. EST detects equivalent search states, which are saved. for all faults during ATPG. The search space is reduced by using learned Search State equiualences to detect previously-encountered search states (possibly from prior faults) and to make internal node assignments. We present two extensions to EST. The first ensures that each portion of the ATPG search space is explored only once. The second applies headline objectives in parallel, rather than serially. For the 1965 ISCAS combinational benchmarks, EST accelerates S 0 CRATES by 6.53 times, when all faults are targeted, and by 5.51 times, when used with random pattern generation, f,iult simulation and fault dropping. This acceleration was achieved with minimal memory overhead.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"44","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519509","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 44

Abstract

We present new extensions to the EST' algoritlm, which accelerates combinational circuit Redundancy Identification and Automatic Test Pattern Generation (ATPG) algorithms, in particular SOCRATES. EST detects equivalent search states, which are saved. for all faults during ATPG. The search space is reduced by using learned Search State equiualences to detect previously-encountered search states (possibly from prior faults) and to make internal node assignments. We present two extensions to EST. The first ensures that each portion of the ATPG search space is explored only once. The second applies headline objectives in parallel, rather than serially. For the 1965 ISCAS combinational benchmarks, EST accelerates S 0 CRATES by 6.53 times, when all faults are targeted, and by 5.51 times, when used with random pattern generation, f,iult simulation and fault dropping. This acceleration was achieved with minimal memory overhead.
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搜索状态等价,进行冗余识别和测试生成
我们提出了EST算法的新扩展,它加速了组合电路冗余识别和自动测试模式生成(ATPG)算法,特别是苏格拉底。EST检测等效的搜索状态,并将其保存。在ATPG过程中出现的所有故障。通过使用学习到的搜索状态等价来检测以前遇到的搜索状态(可能来自先前的错误)并进行内部节点分配,从而减少了搜索空间。我们提出了对EST的两个扩展。第一个确保ATPG搜索空间的每个部分只被探索一次。第二种方法是并行地、而不是连续地应用标题目标。对于1965年ISCAS组合基准测试,当所有故障都被定位时,EST加速了6.53倍的S 0 CRATES,当与随机模式生成、f、故障模拟和故障下降一起使用时,EST加速了5.51倍。这种加速是以最小的内存开销实现的。
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