Alarm performance retention via Web-base diagnostic platform

Yi-Chun Chang, Ming-Wei Lee, Kewei Zuo, Tzxy-Chyi Wang, Huei-Shyang You
{"title":"Alarm performance retention via Web-base diagnostic platform","authors":"Yi-Chun Chang, Ming-Wei Lee, Kewei Zuo, Tzxy-Chyi Wang, Huei-Shyang You","doi":"10.1109/SMTW.2004.1393751","DOIUrl":null,"url":null,"abstract":"A framework for improving alarm performance is proposed and a more detailed flowchart is also described in this paper. Alarm systems are complicated and the improvement requires long-term efforts. The proposed procedure has reduced unnecessary alarms effectively. The architecture of an Internet service is also proposed","PeriodicalId":369092,"journal":{"name":"2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMTW.2004.1393751","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A framework for improving alarm performance is proposed and a more detailed flowchart is also described in this paper. Alarm systems are complicated and the improvement requires long-term efforts. The proposed procedure has reduced unnecessary alarms effectively. The architecture of an Internet service is also proposed
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
通过基于web的诊断平台保留告警性能
本文提出了一种提高报警性能的框架,并给出了较为详细的工作流程。报警系统复杂,改进需要长期努力。该方法有效地减少了不必要的报警。提出了Internet服务的体系结构
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An e-Diagnostics framework with security considerations for semiconductor factories Feasibility of measuring four profile parameters for metal-0 trench of DRAM by spectroscopic ellipsometry based profile technology Learning software agent design for semiconductor tool group dispatching Selectivity investigation of HfO/sub 2/ to oxide using wet etching Strategy and benefit analysis of water saving in 8" semiconductor fab
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1