{"title":"Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits","authors":"W. Wong, J. Liou, Jiann-Shiun Yuan, David M. Wu","doi":"10.1109/VTEST.1991.208141","DOIUrl":null,"url":null,"abstract":"A computer-aided design tool for testing MOSFET integrated circuit performance as functions of MOSFET channel length and channel width variations is presented. The numerical model, which is developed based on the Tellegen's theorem and a database that contains the statistical information of MOSFET process parameters, is implemented in SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier is carried out to illustrate the usefulness of the present work.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"73 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A computer-aided design tool for testing MOSFET integrated circuit performance as functions of MOSFET channel length and channel width variations is presented. The numerical model, which is developed based on the Tellegen's theorem and a database that contains the statistical information of MOSFET process parameters, is implemented in SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier is carried out to illustrate the usefulness of the present work.<>
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