{"title":"CHARGE EMISSION AND ACCUMULATION IN MULTIPLE-PULSE DAMAGE OF SILICON.","authors":"Y. Jhee, M. Becker, R. Walser","doi":"10.1520/STP23114S","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1986-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"National Bureau of Standards, Special Publication","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1520/STP23114S","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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