G. A. Candela, D. Chandler-Horowitz, J. Marchiando, D. Novotny, Barbara J. Belzer, M. Croarkin
{"title":"Preparation and certification of SRM-2530, ellipsometric parameters Δ and ψ and derived thickness and refractive index of a silicon dioxide layer on silicon","authors":"G. A. Candela, D. Chandler-Horowitz, J. Marchiando, D. Novotny, Barbara J. Belzer, M. Croarkin","doi":"10.6028/NBS.SP.260-109","DOIUrl":"https://doi.org/10.6028/NBS.SP.260-109","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134073703","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SURFACE POTENTIAL AS A LASER DAMAGE DIAGNOSTIC.","authors":"M. Becker, J. Kardach, A. Stewart, A. Guenther","doi":"10.1520/STP23113S","DOIUrl":"https://doi.org/10.1520/STP23113S","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114081342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"CHARGE EMISSION AND ACCUMULATION IN MULTIPLE-PULSE DAMAGE OF SILICON.","authors":"Y. Jhee, M. Becker, R. Walser","doi":"10.1520/STP23114S","DOIUrl":"https://doi.org/10.1520/STP23114S","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"54 60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127939997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Charge Emission and Related Precursor Events Associated with Laser Damage","authors":"M. Becker, F. Domann, A. Stewart, A. Guenther","doi":"10.1520/STP28998S","DOIUrl":"https://doi.org/10.1520/STP28998S","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117075129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Strengthening CsI Crystals for Optical Applications","authors":"W. W. Durand, B. Koepke, W. Gerberich","doi":"10.1520/STP28961S","DOIUrl":"https://doi.org/10.1520/STP28961S","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125231061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Activation foil irradiation by reactor cavity fission sources","authors":"G. Lamaze, J. Grundl","doi":"10.6028/NBS.SP.250-14","DOIUrl":"https://doi.org/10.6028/NBS.SP.250-14","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126667633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Solid-state DC voltage standard calibrations","authors":"B. Field","doi":"10.6028/NBS.SP.250-28","DOIUrl":"https://doi.org/10.6028/NBS.SP.250-28","url":null,"abstract":"","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124049836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
................................................... 1 1 . INTRODUCTION ........................................... 2 Laboratory ...................................... 3 1.3 The Signals Connected to the Measurement System ... 7 1.1 What the New Service Does for the Calibration ........ 1.2 How the Frequency Measurement System Works 6 2 . THE THEORY OF FREQUENCY MEASUREMENTS ................... 9 2.1 Why Frequency Calibrations Are Unique ............. 10 2.2 Traceability for Frequency Calibrations ........... 11 2.3 Laboratory ...................................... 13 2.4 Oscillator Specifications ......................... 13 2.5 What Does a Frequency Calibration Measure? ........ 15 2.6 The Characteristics of Different Kinds of 2.7 Setting Up the Frequency Lab ...................... 19 2.8 Record Keeping for Frequency Calibrations ......... 21 Frequency Calibration Options Available to the Oscillators ..................................... 17
{"title":"Traceable frequency calibrations. How to use the NBS frequency measurement system in the calibration lab","authors":"G. Kamas, M. Lombardi","doi":"10.6028/NBS.SP.250-29","DOIUrl":"https://doi.org/10.6028/NBS.SP.250-29","url":null,"abstract":"................................................... 1 1 . INTRODUCTION ........................................... 2 Laboratory ...................................... 3 1.3 The Signals Connected to the Measurement System ... 7 1.1 What the New Service Does for the Calibration ........ 1.2 How the Frequency Measurement System Works 6 2 . THE THEORY OF FREQUENCY MEASUREMENTS ................... 9 2.1 Why Frequency Calibrations Are Unique ............. 10 2.2 Traceability for Frequency Calibrations ........... 11 2.3 Laboratory ...................................... 13 2.4 Oscillator Specifications ......................... 13 2.5 What Does a Frequency Calibration Measure? ........ 15 2.6 The Characteristics of Different Kinds of 2.7 Setting Up the Frequency Lab ...................... 19 2.8 Record Keeping for Frequency Calibrations ......... 21 Frequency Calibration Options Available to the Oscillators ..................................... 17","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114627274","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A topological approach to the matching of single fingerprints: development of algorithms for use on latent fingermarks","authors":"M. K. Sparrow, P. Sparrow","doi":"10.6028/NBS.SP.500-124","DOIUrl":"https://doi.org/10.6028/NBS.SP.500-124","url":null,"abstract":"1 Chapter","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132238987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tableaux recapitulatifs indiquant la composition, l'utilite et les remarques concernant chaque materiaux standards de reference. Les copies des certificats de ces standards se trouvent dans l'appendice
总结表，显示每个参考标准材料的组成、用途和备注。这些标准的证书副本载于附录
{"title":"Standard Reference Materials :: Summary of the environmental research, analysis, and control standards issued by the National Bureau of Standards/","authors":"R. Mavrodineanu, S. Rasberry","doi":"10.6028/NBS.SP.260-105","DOIUrl":"https://doi.org/10.6028/NBS.SP.260-105","url":null,"abstract":"Tableaux recapitulatifs indiquant la composition, l'utilite et les remarques concernant chaque materiaux standards de reference. Les copies des certificats de ces standards se trouvent dans l'appendice","PeriodicalId":212922,"journal":{"name":"National Bureau of Standards, Special Publication","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121528883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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