J. Heidecker, M. White, M. Cooper, D. Sheldon, F. Irom, D. Nguyen
{"title":"Qualification of 128 Gb MLC NAND Flash for SMAP space mission","authors":"J. Heidecker, M. White, M. Cooper, D. Sheldon, F. Irom, D. Nguyen","doi":"10.1109/IIRW.2010.5706510","DOIUrl":null,"url":null,"abstract":"Screening and qualification of a 128 Gb multi-level-cell (MLC) NAND Flash device for the Soil Moisture Passive Active (SMAP) mission (http://smap.jpl.nasa.gov/) is presented here. The MLC technology used in this high density device requires testing above and beyond the typical space test flow.","PeriodicalId":332664,"journal":{"name":"2010 IEEE International Integrated Reliability Workshop Final Report","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Integrated Reliability Workshop Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IIRW.2010.5706510","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Screening and qualification of a 128 Gb multi-level-cell (MLC) NAND Flash device for the Soil Moisture Passive Active (SMAP) mission (http://smap.jpl.nasa.gov/) is presented here. The MLC technology used in this high density device requires testing above and beyond the typical space test flow.
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