M. Deloge, B. Allard, P. Candelier, J. Damiens, E. Le-Roux, M. Rafik
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引用次数: 2
Abstract
The lifetime modeling of antifuse bit cells is studied using transient measurements. Firstly, the wearout current is successfully modeled as Fowler-Nordheim. Secondly, the TDDB power-law voltage acceleration model is validated down to 30 0ns for a stress voltage of 5.5 V. Lifetime results are compared with the Multi-Vibrational Hydrogen Release Model.
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