InP/GaAsSb/InP double heterojunction bipolar transistors with high cut-off frequencies and breakdown voltages

N. Matine, M. Dvorak, X.G. Xu, S. Watkins, C. Bolognesi
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引用次数: 2

Abstract

In this work, we report on the DC and microwave performance of MOCVD-grown carbon-doped InP/GaAsSb/InP double heterojunction transistors (DHBTs) with various collector thicknesses. The cut-off frequencies (and breakdown voltages) are 106 GHz (8 V), 82 GHz (10 V) and 40 GHz (15 V) for the 2000 /spl Aring/, 3000 /spl Aring/ and 5000 /spl Aring/, lightly doped collectors. The 106 GHz, which is the best f/sub T/ ever reported in this material system, is obtained while maintaining a relatively high breakdown voltage (BV/sub CEO/=8 V). The lower cut-off frequencies obtained for the 3000 /spl Aring/ and 5000 /spl Aring/, collectors are attributed to the longer transit time in the collector and also to the Kirk like limitation brought about by high current densities in the thicker collectors.
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具有高截止频率和击穿电压的InP/GaAsSb/InP双异质结双极晶体管
在这项工作中,我们报告了mocvd生长的不同集电极厚度的掺杂碳的InP/GaAsSb/InP双异质结晶体管(dhbt)的直流和微波性能。2000 /spl Aring/、3000 /spl Aring/和5000 /spl Aring/轻掺杂集电极的截止频率(和击穿电压)分别为106 GHz (8 V)、82 GHz (10 V)和40 GHz (15 V)。在保持较高击穿电压(BV/sub - CEO/=8 V)的情况下,获得了106 GHz的最佳f/sub - T/。3000 /spl和5000 /spl Aring/集热器获得了较低的截止频率,这是由于集热器中的传输时间较长,也归因于高电流密度在较厚的集热器中带来的柯克式限制。
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