Single Event Effect prediction early in the design phase and latchup case study on ASIC

N. Andrianjohany, G. Augustin, K. Coulié, L. Gouyet, W. Rahajandraibe, N. Chatry, D. Standarovski, R. Ecoffet
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引用次数: 1

Abstract

We provide an experimental verification of SEE prediction results in continuity of our previous works. The aim of this study is to bring new contributions to the understanding of the various aspects related to prediction issues, and the keys physical mechanisms which have to be considered. We propose a feasibility study of the simulation methods integrated to the circuit development flow. Our TRADCARE© software is confronted to a real case application of an ASIC development dedicated to the experimental study. The testchip was manufactured and then tested under irradiation. The SEL results obtained allowed comparisons between simulation and experience.
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设计阶段早期的单事件效应预测及ASIC上的闭锁案例研究
我们对SEE预测结果进行了实验验证,延续了我们之前的工作。本研究的目的是为理解与预测问题相关的各个方面以及必须考虑的关键物理机制带来新的贡献。我们提出了将仿真方法集成到电路开发流程中的可行性研究。我们的TRADCARE©软件面对一个专用于实验研究的ASIC开发的实际案例应用。测试芯片被制造出来,然后在辐照下进行测试。获得的SEL结果允许在模拟和经验之间进行比较。
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