{"title":"New DRAM HCI qualification method emphasizing on repeated memory access","authors":"P. Chia, Shi-Jie Wen, S. Baeg","doi":"10.1109/IIRW.2010.5706509","DOIUrl":null,"url":null,"abstract":"This paper proposes a new accelerated HCI reliability stress method specifically targeting DRAM components. The merit of this stress method is to provide the worst case design requirement of the data word access rate.","PeriodicalId":332664,"journal":{"name":"2010 IEEE International Integrated Reliability Workshop Final Report","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Integrated Reliability Workshop Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IIRW.2010.5706509","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
This paper proposes a new accelerated HCI reliability stress method specifically targeting DRAM components. The merit of this stress method is to provide the worst case design requirement of the data word access rate.
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