Performance Analysis Of Metalloid Source/ Drain GaAs-FinFET For Analog/RF Applications

Yogesh Pratap, Reshma Sinha, Praveen Pal, Sarul Malik, S. Kabra, Sachin Kumar
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Abstract

In this paper, FinFET device with metalloid source/drain and GaAs channel has been proposed for Analog/RF Applications. Drain current, transconductance, intrinsic gain, device efficiency, cut-off frequency, and VIP3 has been analysed by using ATLAS 3D TCAD simulator. A comprehensive comparative analysis has been carried out between FinFET device with and without metalloid source/drain. The drastic enhancement in device performance makes Metalloid-S/D-GaAs FinFET as a ultimate novel device structure for high-frequency applications.
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用于模拟/射频应用的金属状源极/漏极gaas finfet的性能分析
本文提出了一种具有金属状源/漏极和GaAs通道的FinFET器件,用于模拟/射频应用。利用ATLAS 3D TCAD模拟器对漏极电流、跨导、固有增益、器件效率、截止频率和VIP3进行了分析。对具有和不具有类金属源极/漏极的FinFET器件进行了全面的比较分析。器件性能的急剧提高使Metalloid-S/D-GaAs FinFET成为高频应用的终极新型器件结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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