K. Seidel, R. Hoffmann, A. Naumann, J. Paul, D. Lohr, M. Czernohorsky, V. Beyer
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引用次数: 0
Abstract
Random Telegraph Noise (RTN) characterization was performed on charge-trap-based TANOS memory cells. The analysis results of cycle stress dependence and cell size scaling are discussed based on single cell measurements. Comparing charge-trap and floating-gate memory technologies different behavior for RTN was obtained. On charge-trap cells a threshold voltage dependence and superimposed noise was observed and is discussed based on measurement results and different cell architectures.
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