{"title":"THE INTERACTION OF TEST AND QUALITY","authors":"P. Maxwell","doi":"10.1109/TEST.1991.519794","DOIUrl":null,"url":null,"abstract":"From the perspective of manufacturing environments, the production of integrated circuits is unique, and presents significant challenges. The fundamental problem is that the process by which these ICs are made introduces so many defects into the part being manufactured that we are lucky if we get as many as half of the produced parts being defect-free. For large, complex chips the situation is considerably worse.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519794","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
From the perspective of manufacturing environments, the production of integrated circuits is unique, and presents significant challenges. The fundamental problem is that the process by which these ICs are made introduces so many defects into the part being manufactured that we are lucky if we get as many as half of the produced parts being defect-free. For large, complex chips the situation is considerably worse.
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