{"title":"SPC precaution system","authors":"M.F. Chen, M. Huang","doi":"10.1109/SMTW.2004.1393761","DOIUrl":null,"url":null,"abstract":"Every module setup lot of charts to monitor off-line process data. Most of charts are sensitive to inline process data. Although each of charts had set control limit and specification to warn the process while trending up or down, there are still have risk to cause product fail due to narrow process window. It's very difficult and impossible to take care of all charts on manufacturing to find which of them are not stable. The paper shows a new methodology to take care of all of chart on manufacturing. The engineers only have to group the charts having the same process property (ex, resist THK, CD, Overlay, ETH, Etch-Rate, etc...) on system. This system will automatic create report and send the warning messages to engineer through the e-mail. It is very helpful for the module to find out which are the worst or getting worse charts. Engineer can take action early before the chart going worst and all of abnormal event can be prevented in advance. This new methodology not only increased the stability of production line, but also saved lot of manpower to handle abnormal event","PeriodicalId":369092,"journal":{"name":"2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Semiconductor Manufacturing Technology Workshop Proceedings (IEEE Cat. No.04EX846)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMTW.2004.1393761","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Every module setup lot of charts to monitor off-line process data. Most of charts are sensitive to inline process data. Although each of charts had set control limit and specification to warn the process while trending up or down, there are still have risk to cause product fail due to narrow process window. It's very difficult and impossible to take care of all charts on manufacturing to find which of them are not stable. The paper shows a new methodology to take care of all of chart on manufacturing. The engineers only have to group the charts having the same process property (ex, resist THK, CD, Overlay, ETH, Etch-Rate, etc...) on system. This system will automatic create report and send the warning messages to engineer through the e-mail. It is very helpful for the module to find out which are the worst or getting worse charts. Engineer can take action early before the chart going worst and all of abnormal event can be prevented in advance. This new methodology not only increased the stability of production line, but also saved lot of manpower to handle abnormal event
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程控预防系统
每个模块都设置了大量的图表来监控离线过程数据。大多数图表对内联过程数据很敏感。虽然每个图表都设置了控制限制和规范,以在趋势上升或下降时警告工艺,但由于工艺窗口狭窄,仍然存在导致产品失败的风险。要查看所有的生产图表,找出哪些是不稳定的,这是非常困难和不可能的。本文提出了一种处理制造过程中所有图表的新方法。工程师只需要在系统上对具有相同工艺属性(例如,抗THK, CD, Overlay, ETH, Etch-Rate等)的图表进行分组。该系统将自动生成报告,并通过电子邮件将警告信息发送给工程师。这是非常有帮助的模块找出哪些是最差的或越来越差的图表。工程师可以在海图恶化之前采取措施,提前预防所有异常事件。该方法不仅提高了生产线的稳定性,而且节省了大量处理异常事件的人力
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