C. K. Wong, S. Y. Y. Leung, R. Poelma, K. Jansen, C. Yuan, W. V. van Driel, G. Zhang
{"title":"Molecular Dynamics study of the traction-displacement relations of epoxy-copper interfaces","authors":"C. K. Wong, S. Y. Y. Leung, R. Poelma, K. Jansen, C. Yuan, W. V. van Driel, G. Zhang","doi":"10.1109/ESIME.2011.5765785","DOIUrl":null,"url":null,"abstract":"The traction-displacement relations of the epoxy-copper interfaces are studied using an atomistic model. The reaction force of the epoxy layer in response to displacement of the interface is calculated during molecular dynamics simulation. A parametric study in terms of displacement rate and the step size of displacement increment has been performed. The traction-displacement relations are found sensitive to the step size of the displacement increment. The traction-displacement relations are better described with a small displacement increment in the initial region where the epoxy-copper interface is in close contact. The interfacial energy as calculated by the traction-displacement model is −0.28 Jm−2 which is comparable to the value obtained from a static model. This calculated value is also close to the thermodynamic work of adhesion (−0.26 Jm−2) of an epoxy-copper system as reported in the literature [1].","PeriodicalId":115489,"journal":{"name":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2011.5765785","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The traction-displacement relations of the epoxy-copper interfaces are studied using an atomistic model. The reaction force of the epoxy layer in response to displacement of the interface is calculated during molecular dynamics simulation. A parametric study in terms of displacement rate and the step size of displacement increment has been performed. The traction-displacement relations are found sensitive to the step size of the displacement increment. The traction-displacement relations are better described with a small displacement increment in the initial region where the epoxy-copper interface is in close contact. The interfacial energy as calculated by the traction-displacement model is −0.28 Jm−2 which is comparable to the value obtained from a static model. This calculated value is also close to the thermodynamic work of adhesion (−0.26 Jm−2) of an epoxy-copper system as reported in the literature [1].
用原子模型研究了环氧树脂-铜界面的牵引-位移关系。在分子动力学模拟中,计算了界面位移对环氧层反作用力的响应。从位移速率和位移增量步长两个方面进行了参数化研究。牵引力-位移关系对位移增量的步长很敏感。在环氧-铜界面紧密接触的初始区域,位移增量较小,可以更好地描述牵引力-位移关系。牵引力-位移模型计算得到的界面能为- 0.28 Jm - 2,与静态模型计算得到的界面能相当。该计算值也接近文献[1]中报道的环氧-铜体系的粘接热力学功(- 0.26 Jm - 2)。