A Strained Superlattice Buffer Layer for InGaAs/GaAs Quantum Wells

T. E. VanEck, S. Niki, P. Chu, W. Chang, H. Wieder, A. Mardinly, K. Aron, G. Hansen
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Abstract

Good electroabsorption has been demonstrated recently in InGaAs/GaAs quantum wells.1,2 A structure described previously1 had only ten quantum wells, and although InGaAs and GaAs are not lattice-matched, the total strain energy in this structure was small enough that the quantum wells grew pseudomorphically, i. e., the InGaAs was strained so that its in-plane lattice constant was equal to the lattice constant of the GaAs substrate. This structure showed good electroabsorption characteristics, but only 6% modulation depth. For a device with 50% modulation depth, about 100 quantum wells are required. However, structures containing only 20 quantum wells appeared to be non-pseudomorphic. Thus 100 quantum wells can not be grown pseudomorphic to the substrate, yet they must be grown with no dislocations to have good electroabsorption characteristics. This can be accomplished by growing the quantum well structure on top of a thick, uniform buffer layer with a lattice constant equal to the weighted average of the lattice constants of the quantum well and buffer layers. Lattice relaxation by means of dislocations occurs only in the buffer layer, and both quantum wells and barriers grow pseudomorphic to the buffer layer rather than the substrate.3 A similar result can be achieved by eliminating the buffer layer; the lattice relaxation occurs in the first few quantum wells, and the rest are dislocation-free.2,4,5 We have employed this method to produce a structure with 80 quantum wells which exhibits good electroabsorption characteristics. We have also grown 50 quantum wells on a strained superlattice buffer layer consisting of alternating layers of InGaAs and GaAs, each 20Å thick. The purpose of this is to remove the dislocations from the quantum wells, which are optically active, and place them in the inactive superlattice.
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InGaAs/GaAs量子阱的应变超晶格缓冲层
最近在InGaAs/GaAs量子阱中证明了良好的电吸收。1,2前面描述的结构1只有10个量子阱,尽管InGaAs和GaAs不是晶格匹配的,但该结构中的总应变能足够小,以至于量子阱以伪晶方式生长,即InGaAs被应变使其面内晶格常数等于GaAs衬底的晶格常数。该结构具有良好的电吸收特性,但只有6%的调制深度。对于调制深度为50%的器件,大约需要100个量子阱。然而,只包含20个量子阱的结构似乎是非伪晶的。因此,100个量子阱不能假晶生长到衬底上,但它们必须在没有位错的情况下生长,以具有良好的电吸收特性。这可以通过在厚而均匀的缓冲层上生长量子阱结构来实现,该缓冲层的晶格常数等于量子阱和缓冲层晶格常数的加权平均值。由位错引起的晶格弛豫只发生在缓冲层中,并且量子阱和势垒都向缓冲层而不是基板伪晶生长通过消除缓冲层可以获得类似的结果;晶格弛豫发生在最初的几个量子阱中,其余的是无位错的。我们利用这种方法制备了具有80个量子阱的结构,并表现出良好的电吸收特性。我们还在应变超晶格缓冲层上生长了50个量子阱,该缓冲层由InGaAs和GaAs交替层组成,每个层的厚度为20Å。这样做的目的是去除量子阱中的位错,这些量子阱具有光学活性,并将它们置于非活性超晶格中。
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