Local origins of sensor activity in 1D oxide nanostructures: from spectromicroscopy to device

A. Kolmakov, U. Lanke, J. Shin, S. Jesse, Sergei V. Kalinin, R. Karam
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引用次数: 1

Abstract

We have tested a range of imaging techniques to address local transport behavior in the working metal oxide nanostructure sensor. In particular, we were using scanning surface potential microscopy (SSPM) to dc potential distributions in an operating device. We also have successfully implemented of synchrotron radiation based photoelectron emission spectro-microscopy (PEEM) to explore submicron lateral compositional and electronic (work function) inhomogeneousity in individual nanowire sensor. These results open new avenue to visualize the adsorption / desorption phenomena on individual nanostructure both in real time and at nano- and mesoscopic level
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1D氧化物纳米结构中传感器活性的局部起源:从光谱显微镜到器件
我们已经测试了一系列成像技术来解决工作金属氧化物纳米结构传感器中的局部传输行为。特别是,我们使用扫描表面电位显微镜(SSPM)来观察操作装置中的直流电位分布。我们还成功地实现了基于同步辐射的光电子发射光谱显微镜(PEEM),以探索单个纳米线传感器的亚微米横向组成和电子(功函数)不均匀性。这些结果为在纳米和介观水平上实时观察单个纳米结构上的吸附/解吸现象开辟了新的途径
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