{"title":"Tutorial II: Variability and Its Impact on Design","authors":"K. Bowman, M. Orshansky, S. Sapatnekar","doi":"10.1109/ISQED.2006.141","DOIUrl":null,"url":null,"abstract":"As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"69 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
As digital designs scale down into the sub-100nm regime, the effects of variations are seen to dramatically affect the behavior of the circuit. These may arise from.
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