T. Bonifield, Honglin Guo, Jeff West, H. Shichijo, Talha Tahir
{"title":"High Frequency TDDB of Reinforced Isolation Dielectric Systems","authors":"T. Bonifield, Honglin Guo, Jeff West, H. Shichijo, Talha Tahir","doi":"10.1109/IRPS45951.2020.9128352","DOIUrl":null,"url":null,"abstract":"Reinforced isolation provides protection of equipment and operators that interact with high voltage domains. Standards that define it have evolved over time from those that require only partial discharge to confirm reliability at the high voltage operating conditions, to those that also require a time dependent dielectric breakdown model (TDDB) for verifying reliable working voltage. In this paper we assess the impact of AC frequency, waveform, and rise and fall times on lifetime, which are important parameters that are not included in the current standards.","PeriodicalId":116002,"journal":{"name":"2020 IEEE International Reliability Physics Symposium (IRPS)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS45951.2020.9128352","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Reinforced isolation provides protection of equipment and operators that interact with high voltage domains. Standards that define it have evolved over time from those that require only partial discharge to confirm reliability at the high voltage operating conditions, to those that also require a time dependent dielectric breakdown model (TDDB) for verifying reliable working voltage. In this paper we assess the impact of AC frequency, waveform, and rise and fall times on lifetime, which are important parameters that are not included in the current standards.