S. Hoeffgen, Mirko Liebender, M. Baum, Christopher Carl, O. Felden, Tobias Kündgen, W. Lennartz, S. Metzger, Samuel Plettner, Friedrich Schün
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引用次数: 0
Abstract
The NXP P4080 processor is tested for SEE using a proton beam of up to 500 MeV. Single and multiple bit upsets of the L2 and L3 cache were measured as well as core crashes with different signatures.
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