A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov
{"title":"Heavy-Ion SEE Test Results for Amplifiers","authors":"A. Kalashnikova, V. Anashin, P. Chubunov, A. Koziukov, S. Iakovlev, R. Mangushev, A. Nilov","doi":"10.1109/RADECS45761.2018.9328711","DOIUrl":null,"url":null,"abstract":"The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS45761.2018.9328711","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The paper presents heavy-ion test results for a sample of amplifiers. Linear Energy Transfer (LET) thresholds for Single Event Upset (SEU) and Latchup (SEL) effects, as well as for Destructive Failure (DF), have been obtained during experiments. Additionally, for some amplifiers voltage Safe Operating Area (SOA) has been determined.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
