G. Ghidini, F. Pellizzer, N. Galbiati, D. Brazzelli, D. Peschiaroli, L. Brusaferri
{"title":"Plasma Damage Impact in 0.25 um Dual-Gate Technology","authors":"G. Ghidini, F. Pellizzer, N. Galbiati, D. Brazzelli, D. Peschiaroli, L. Brusaferri","doi":"10.1109/ESSDERC.2000.194768","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":354721,"journal":{"name":"30th European Solid-State Device Research Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"30th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2000.194768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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