Variable-length gateless transistor for analog one-time-programmable memory applications

P. Cheng, Chihching Yang, Meng-Yin Hsu, C. Lin, Y. King
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引用次数: 2

Abstract

This work presents a novel embedded Analog Gateless One-Time-Programming Memory (AG-OTP), implemented by standard CMOS logic process. The NVM cell includes a gateless storage node in series with a select transistor; where the charge stored on the parasitic ONO structure. The p-channel device is programmed by channel hot hole induced hot electron injection (CHHIHE). An angled-shaped source region allows the gateless channel to be partially turned-on and gradually increase the read current level. This unique structure enable the storage of analog data as continuous read current can be readily achieved.
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用于模拟一次性可编程存储器应用的可变长度无门晶体管
本文提出了一种新型嵌入式模拟无门一次性编程存储器(AG-OTP),采用标准CMOS逻辑工艺实现。所述NVM单元包括与所选晶体管串联的无门存储节点;其中电荷存储在寄生的ONO结构上。采用通道热孔诱导热电子注入(CHHIHE)对p通道器件进行编程。角状源区允许部分打开无门通道并逐渐增加读电流水平。这种独特的结构使得模拟数据的存储可以很容易地实现连续读取电流。
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