On the reconfigurable operation of arrays with defects for image processing

Abstract

The authors examine the operation and a reconfiguration strategy for two-dimensional SIMD parallel architectures in the presence of manufacturing cluster defects and/or link defects when used for image processing. The proposed technique is based on a conceptual reconfiguration of processing elements by covering each large defect area with a set of fault-free elements, thus creating a loss of image resolution instead of a loss of image data. The proposed technique has been emulated on a 2048 PE MasPar architecture assuming both mesh connected elements (four-way connection) and eight-way connections.