A. Boubekeur, J. Patry, G. Saucier, M. Slimane-kadi, J. Trilhe
{"title":"A full experience of designing a wafer scale 2D array","authors":"A. Boubekeur, J. Patry, G. Saucier, M. Slimane-kadi, J. Trilhe","doi":"10.1109/ICWSI.1993.255275","DOIUrl":null,"url":null,"abstract":"The design of a wafer scale 2D array called ELSA (European large single instruction, multiple data (SIMD) array) is given. Software methods and tools as well as hardware switching devices used to achieve defect tolerance and create a defect-free 2D array are described. ELSA is implemented in 1.2- mu m CMOS technology and has been studied within an ESPRIT project on wafer scale integration.<<ETX>>","PeriodicalId":377227,"journal":{"name":"1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration","volume":"102 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1993.255275","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The design of a wafer scale 2D array called ELSA (European large single instruction, multiple data (SIMD) array) is given. Software methods and tools as well as hardware switching devices used to achieve defect tolerance and create a defect-free 2D array are described. ELSA is implemented in 1.2- mu m CMOS technology and has been studied within an ESPRIT project on wafer scale integration.<>
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