Subhajit Das, S. Bhattacharya, Debaprasad Das, H. Rahaman
{"title":"Comparative Stability Analysis of Pristine and AsF5 Intercalation Doped Top Contact Graphene Nano Ribbon Interconnects","authors":"Subhajit Das, S. Bhattacharya, Debaprasad Das, H. Rahaman","doi":"10.1109/ISDCS.2019.8719094","DOIUrl":null,"url":null,"abstract":"In this work, a comparative stability analysis of copper (Cu), pristine and AsF5-intercalated top contact (TC) multilayer graphene nanoribbon (MLGNR) interconnect is presented. In this work, Bode stability formalism of AsF5 - intercalated TC-MLGNR interconnect using ABCD transmission parameter based multi-conductor transmission line model, has been presented for the first time. The variation in stability has been studied for conventional copper, pristine and AsF5 intercalated interconnect for different interconnect lengths (10$\\mu$m and 100$\\mu$m) and different level of edge roughness. It is shown that, AsF5-interclation doped TC-MLGNR interconnects offer better stability, for similar dimensions, than its pristine counterpart as well as conventional copper wires at local, intermediate and global interconnect for high frequency applications.","PeriodicalId":293660,"journal":{"name":"2019 2nd International Symposium on Devices, Circuits and Systems (ISDCS)","volume":"173 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 2nd International Symposium on Devices, Circuits and Systems (ISDCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISDCS.2019.8719094","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this work, a comparative stability analysis of copper (Cu), pristine and AsF5-intercalated top contact (TC) multilayer graphene nanoribbon (MLGNR) interconnect is presented. In this work, Bode stability formalism of AsF5 - intercalated TC-MLGNR interconnect using ABCD transmission parameter based multi-conductor transmission line model, has been presented for the first time. The variation in stability has been studied for conventional copper, pristine and AsF5 intercalated interconnect for different interconnect lengths (10$\mu$m and 100$\mu$m) and different level of edge roughness. It is shown that, AsF5-interclation doped TC-MLGNR interconnects offer better stability, for similar dimensions, than its pristine counterpart as well as conventional copper wires at local, intermediate and global interconnect for high frequency applications.