Transistor-level optimization of supergates

D. Kagaris, T. Haniotakis
{"title":"Transistor-level optimization of supergates","authors":"D. Kagaris, T. Haniotakis","doi":"10.1109/ISQED.2006.139","DOIUrl":null,"url":null,"abstract":"The chip area and delay in digital VLSI design depends on the number of transistors that are used for the logic gates involved. While the determination of a series-parallel implementation can be straightforward once a simplified expression of the function is available, this may not be an optimum solution. In the current paper an improved approach for determining a satisfactory solution for complex gates is presented. Experimental results demonstrate the efficiency of the approach","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

The chip area and delay in digital VLSI design depends on the number of transistors that are used for the logic gates involved. While the determination of a series-parallel implementation can be straightforward once a simplified expression of the function is available, this may not be an optimum solution. In the current paper an improved approach for determining a satisfactory solution for complex gates is presented. Experimental results demonstrate the efficiency of the approach
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
超级栅极的晶体管级优化
数字VLSI设计中的芯片面积和延迟取决于所涉及的逻辑门所使用的晶体管数量。虽然一旦函数的简化表达式可用,就可以直接确定串并联实现,但这可能不是最佳解决方案。本文提出了一种确定复杂门的满意解的改进方法。实验结果证明了该方法的有效性
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A DFM methodology to evaluate the impact of lithography conditions on the speed of critical paths in a VLSI circuit Power-aware test pattern generation for improved concurrency at the core level Compact reduced order modeling for multiple-port interconnects Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology Minimizing ohmic loss in future processor IR events
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1