White Noise Suppression Based on Wiener Filtering Using Neural Network Technologies in the Domain of the Discrete Wavelet Transform

Q4 Engineering Russian Microelectronics Pub Date : 2024-02-15 DOI:10.1134/s106373972307003x
K. A. Alimagadov, S. V. Umnyashkin
{"title":"White Noise Suppression Based on Wiener Filtering Using Neural Network Technologies in the Domain of the Discrete Wavelet Transform","authors":"K. A. Alimagadov, S. V. Umnyashkin","doi":"10.1134/s106373972307003x","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">\n<b>Abstract</b>—</h3><p>Computer vision algorithms are widely used in solving a number of applied problems. The correct operation of such algorithms depends on the photo and video data that they receive at the input, which are subject to the effect of noise; hence, noise suppression is an important stage in low-level digital image processing. In this work, the Wiener filtering of normal white noise with using neural networks in the domain of the discrete wavelet transform is studied. The architecture of the networks and the algorithm developed for their application for filtering in the domain of a discrete wavelet transform are described. The proposed algorithm is tested on the BSDS500 dataset at various noise levels. The filtering quality is evaluated by the calculated signal-to-noise ratio (SNR) and structural similarity index (SSIM) values. The results of processing test images indicate that the developed algorithm is superior in noise reduction quality to most of the other considered filters, including Wiener filtering without the use of neural networks in the domain of the discrete wavelet transform.</p>","PeriodicalId":21534,"journal":{"name":"Russian Microelectronics","volume":"26 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Russian Microelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1134/s106373972307003x","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0

Abstract

Computer vision algorithms are widely used in solving a number of applied problems. The correct operation of such algorithms depends on the photo and video data that they receive at the input, which are subject to the effect of noise; hence, noise suppression is an important stage in low-level digital image processing. In this work, the Wiener filtering of normal white noise with using neural networks in the domain of the discrete wavelet transform is studied. The architecture of the networks and the algorithm developed for their application for filtering in the domain of a discrete wavelet transform are described. The proposed algorithm is tested on the BSDS500 dataset at various noise levels. The filtering quality is evaluated by the calculated signal-to-noise ratio (SNR) and structural similarity index (SSIM) values. The results of processing test images indicate that the developed algorithm is superior in noise reduction quality to most of the other considered filters, including Wiener filtering without the use of neural networks in the domain of the discrete wavelet transform.

Abstract Image

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
在离散小波变换领域利用神经网络技术实现基于维纳滤波的白噪声抑制
摘要--计算机视觉算法被广泛应用于解决许多应用问题。这些算法的正确运行取决于其输入端接收到的照片和视频数据,而这些数据会受到噪声的影响;因此,噪声抑制是低级数字图像处理中的一个重要阶段。在这项工作中,研究了在离散小波变换域中使用神经网络对正常白噪声进行维纳滤波。文中介绍了网络的结构以及为在离散小波变换域中进行滤波而开发的算法。在 BSDS500 数据集上对所提出的算法进行了各种噪声水平的测试。通过计算信噪比(SNR)和结构相似性指数(SSIM)值来评估过滤质量。处理测试图像的结果表明,所开发的算法在降噪质量方面优于大多数其他滤波器,包括在离散小波变换域中不使用神经网络的维纳滤波。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Russian Microelectronics
Russian Microelectronics Materials Science-Materials Chemistry
CiteScore
0.70
自引率
0.00%
发文量
43
期刊介绍: Russian Microelectronics  covers physical, technological, and some VLSI and ULSI circuit-technical aspects of microelectronics and nanoelectronics; it informs the reader of new trends in submicron optical, x-ray, electron, and ion-beam lithography technology; dry processing techniques, etching, doping; and deposition and planarization technology. Significant space is devoted to problems arising in the application of proton, electron, and ion beams, plasma, etc. Consideration is given to new equipment, including cluster tools and control in situ and submicron CMOS, bipolar, and BICMOS technologies. The journal publishes papers addressing problems of molecular beam epitaxy and related processes; heterojunction devices and integrated circuits; the technology and devices of nanoelectronics; and the fabrication of nanometer scale devices, including new device structures, quantum-effect devices, and superconducting devices. The reader will find papers containing news of the diagnostics of surfaces and microelectronic structures, the modeling of technological processes and devices in micro- and nanoelectronics, including nanotransistors, and solid state qubits.
期刊最新文献
A Comprehensive Study of Nonuniformity Properties of the LiCoO2 Thin-Film Cathode Fabricated by RF Sputtering Structure and Formation of Superflash Nonvolatile Memory Cells Influence of Laser Radiation on Functional Properties MOS Device Structures Simulation of Silicon Field-Effect Conical GAA Nanotransistors with a Stacked SiO2/HfO2 Subgate Dielectric Influence of Hydrogen Additive on Electrophysical Parameters and Emission Spectra of Tetrafluoromethane Plasma
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1