Xiaodong Gou;Ao Zhang;Chengguang Wang;Yan Liu;Xue Zhao;Shunkun Yang
{"title":"Software Fault Localization Based on Network Spectrum and Graph Neural Network","authors":"Xiaodong Gou;Ao Zhang;Chengguang Wang;Yan Liu;Xue Zhao;Shunkun Yang","doi":"10.1109/TR.2024.3374410","DOIUrl":null,"url":null,"abstract":"Accurate fault localization renders software test resource allocation and maintenance cost-efficient. However, this is challenging when there are false alarm repercussions caused by module coupling of complex software. In this article, therefore, we propose a new method for multiple software fault localization from the perspective of network spectrum based on a graph neural network model. First, we constructed the network model of the software under test to represent the coupling relationships among software modules based on complex network theory. In addition, test suits were executed and recorded to construct the program spectrum. Subsequently, the software network and program spectrum were fused into the network spectrum, and we reprocessed it with feature dimension reduction, normalization, and graph-based class-imbalance treatment. The graph neural network was then used to construct a multiple-fault location model based on the processed network spectrum. Empirical studies were performed on the Defects4J dataset. The experimental results indicated that the proposed method outperformed six baseline methods (with an average improvement of 13.03% on the T-EXAMscore). This study is expected to provide insights into more smart software quality and reliability assurance.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"73 4","pages":"1819-1833"},"PeriodicalIF":5.0000,"publicationDate":"2024-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10477224/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate fault localization renders software test resource allocation and maintenance cost-efficient. However, this is challenging when there are false alarm repercussions caused by module coupling of complex software. In this article, therefore, we propose a new method for multiple software fault localization from the perspective of network spectrum based on a graph neural network model. First, we constructed the network model of the software under test to represent the coupling relationships among software modules based on complex network theory. In addition, test suits were executed and recorded to construct the program spectrum. Subsequently, the software network and program spectrum were fused into the network spectrum, and we reprocessed it with feature dimension reduction, normalization, and graph-based class-imbalance treatment. The graph neural network was then used to construct a multiple-fault location model based on the processed network spectrum. Empirical studies were performed on the Defects4J dataset. The experimental results indicated that the proposed method outperformed six baseline methods (with an average improvement of 13.03% on the T-EXAMscore). This study is expected to provide insights into more smart software quality and reliability assurance.
Maria João Forjaz , Carmen Rodriguez-Blazquez , Alba Ayala , Vicente Rodriguez-Rodriguez , Jesús de Pedro-Cuesta , Susana Garcia-Gutierrez , Alexandra Prados-Torres
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.