Software Fault Localization Based on Network Spectrum and Graph Neural Network

IF 5 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Transactions on Reliability Pub Date : 2024-03-20 DOI:10.1109/TR.2024.3374410
Xiaodong Gou;Ao Zhang;Chengguang Wang;Yan Liu;Xue Zhao;Shunkun Yang
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Abstract

Accurate fault localization renders software test resource allocation and maintenance cost-efficient. However, this is challenging when there are false alarm repercussions caused by module coupling of complex software. In this article, therefore, we propose a new method for multiple software fault localization from the perspective of network spectrum based on a graph neural network model. First, we constructed the network model of the software under test to represent the coupling relationships among software modules based on complex network theory. In addition, test suits were executed and recorded to construct the program spectrum. Subsequently, the software network and program spectrum were fused into the network spectrum, and we reprocessed it with feature dimension reduction, normalization, and graph-based class-imbalance treatment. The graph neural network was then used to construct a multiple-fault location model based on the processed network spectrum. Empirical studies were performed on the Defects4J dataset. The experimental results indicated that the proposed method outperformed six baseline methods (with an average improvement of 13.03% on the T-EXAMscore). This study is expected to provide insights into more smart software quality and reliability assurance.
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基于网络频谱和图神经网络的软件故障定位
准确的故障定位使软件测试资源分配和维护成本更低。然而,当复杂软件的模块耦合导致误报时,这是具有挑战性的。因此,本文提出了一种基于图神经网络模型的从网络频谱角度进行多软件故障定位的新方法。首先,基于复杂网络理论,构建被测软件的网络模型,表征软件模块间的耦合关系;另外,测试套装被执行并记录以构建程序谱。随后,将软件网络和程序频谱融合为网络频谱,并对其进行特征降维、归一化和基于图的类不平衡处理等再处理。然后基于处理后的网络频谱,利用图神经网络构建多故障定位模型。对缺陷4j数据集进行了实证研究。实验结果表明,该方法优于6种基准方法(T-EXAMscore平均提高13.03%)。该研究有望为更智能的软件质量和可靠性保证提供见解。
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来源期刊
IEEE Transactions on Reliability
IEEE Transactions on Reliability 工程技术-工程:电子与电气
CiteScore
12.20
自引率
8.50%
发文量
153
审稿时长
7.5 months
期刊介绍: IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.
期刊最新文献
Table of Contents IEEE Reliability Society Information Editorial: Applied AI for Reliability and Cybersecurity 2024 Index IEEE Transactions on Reliability Vol. 73 Table of Contents
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