E. G. Nikonov, R. G. Nazmitdinov, P. I. Glukhovtsev
{"title":"Manifestation of the Hexatic Phase in Confined Two-Dimensional Systems with Circular Symmetry","authors":"E. G. Nikonov, R. G. Nazmitdinov, P. I. Glukhovtsev","doi":"10.1134/s1027451024020149","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Quasi-two-dimensional systems play an important role in the manufacture of various devices for the needs of nanoelectronics. Obviously, the functional efficiency of such systems depends on their structure, which can change during phase transitions under the influence of external conditions (e.g., temperature). Until now, the main attention has been focused on the search for signals of phase transitions in continuous two-dimensional systems. One of the central issues is the analysis of conditions for the nucleation of the hexatic phase in such systems, which is accompanied by the appearance of defects in the Wigner crystalline phase at a certain temperature. However, both practical and fundamental questions arise about the critical number of electrons at which the symmetry of the crystal lattice in the system under consideration will begin to break and, consequently, the nucleation of defects will start. The dependences of the orientational order parameter and the correlation function, which characterize topological phase transitions, as functions of the number of particles at zero temperature have been studied. The calculation results allow us to establish the precursors of the phase transition from the hexagonal phase to the hexatic one for <i>N</i> = 92, 136, and 187 considered as an example.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":null,"pages":null},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1134/s1027451024020149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Quasi-two-dimensional systems play an important role in the manufacture of various devices for the needs of nanoelectronics. Obviously, the functional efficiency of such systems depends on their structure, which can change during phase transitions under the influence of external conditions (e.g., temperature). Until now, the main attention has been focused on the search for signals of phase transitions in continuous two-dimensional systems. One of the central issues is the analysis of conditions for the nucleation of the hexatic phase in such systems, which is accompanied by the appearance of defects in the Wigner crystalline phase at a certain temperature. However, both practical and fundamental questions arise about the critical number of electrons at which the symmetry of the crystal lattice in the system under consideration will begin to break and, consequently, the nucleation of defects will start. The dependences of the orientational order parameter and the correlation function, which characterize topological phase transitions, as functions of the number of particles at zero temperature have been studied. The calculation results allow us to establish the precursors of the phase transition from the hexagonal phase to the hexatic one for N = 92, 136, and 187 considered as an example.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
