Qifang Liu;Lu Jin;Hon Keung Tony Ng;Qingpei Hu;Dan Yu
{"title":"Multivariate $t$ Degradation Processes for Dependent Multivariate Degradation Data","authors":"Qifang Liu;Lu Jin;Hon Keung Tony Ng;Qingpei Hu;Dan Yu","doi":"10.1109/TR.2024.3398652","DOIUrl":null,"url":null,"abstract":"Multiple performance characteristics (PCs) are common in modern products with complex structures and diverse functions. These PCs are usually dependent, with significant unit-specific variability among the multivariate degradation processes. Therefore, the associated degradation modeling for dependent multivariate degradation processes is important. This article proposes a novel multivariate <inline-formula><tex-math>$t$</tex-math></inline-formula> degradation model for this purpose. Specifically, the dependence between multivariate degradation processes is captured by random drift parameters that follow a multivariate normal distribution, and the variation in diffusion parameters and variance–covariance is characterized by a gamma distribution. An expectation-maximization (EM) algorithm is employed for likelihood inference, and confidence intervals of the model parameters are constructed by normal approximation and bootstrap method. A theoretical exploration investigating the effects of model misspecification in multivariate degradation modeling is addressed. Monte Carlo simulation studies are performed to validate the effectiveness of the EM algorithm and the theoretical properties of the multivariate <inline-formula><tex-math>$t$</tex-math></inline-formula> model. Finally, two illustrative examples are used to demonstrate the applicability and advantages of the proposed methods.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 1","pages":"2265-2279"},"PeriodicalIF":5.0000,"publicationDate":"2024-03-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10538172/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Multiple performance characteristics (PCs) are common in modern products with complex structures and diverse functions. These PCs are usually dependent, with significant unit-specific variability among the multivariate degradation processes. Therefore, the associated degradation modeling for dependent multivariate degradation processes is important. This article proposes a novel multivariate $t$ degradation model for this purpose. Specifically, the dependence between multivariate degradation processes is captured by random drift parameters that follow a multivariate normal distribution, and the variation in diffusion parameters and variance–covariance is characterized by a gamma distribution. An expectation-maximization (EM) algorithm is employed for likelihood inference, and confidence intervals of the model parameters are constructed by normal approximation and bootstrap method. A theoretical exploration investigating the effects of model misspecification in multivariate degradation modeling is addressed. Monte Carlo simulation studies are performed to validate the effectiveness of the EM algorithm and the theoretical properties of the multivariate $t$ model. Finally, two illustrative examples are used to demonstrate the applicability and advantages of the proposed methods.
Maria João Forjaz , Carmen Rodriguez-Blazquez , Alba Ayala , Vicente Rodriguez-Rodriguez , Jesús de Pedro-Cuesta , Susana Garcia-Gutierrez , Alexandra Prados-Torres
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.