Multivariate $t$ Degradation Processes for Dependent Multivariate Degradation Data

IF 5.7 2区 计算机科学 Q1 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Transactions on Reliability Pub Date : 2024-03-23 DOI:10.1109/TR.2024.3398652
Qifang Liu;Lu Jin;Hon Keung Tony Ng;Qingpei Hu;Dan Yu
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Abstract

Multiple performance characteristics (PCs) are common in modern products with complex structures and diverse functions. These PCs are usually dependent, with significant unit-specific variability among the multivariate degradation processes. Therefore, the associated degradation modeling for dependent multivariate degradation processes is important. This article proposes a novel multivariate $t$ degradation model for this purpose. Specifically, the dependence between multivariate degradation processes is captured by random drift parameters that follow a multivariate normal distribution, and the variation in diffusion parameters and variance–covariance is characterized by a gamma distribution. An expectation-maximization (EM) algorithm is employed for likelihood inference, and confidence intervals of the model parameters are constructed by normal approximation and bootstrap method. A theoretical exploration investigating the effects of model misspecification in multivariate degradation modeling is addressed. Monte Carlo simulation studies are performed to validate the effectiveness of the EM algorithm and the theoretical properties of the multivariate $t$ model. Finally, two illustrative examples are used to demonstrate the applicability and advantages of the proposed methods.
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依赖多元降解数据的多元 $t$ 降解过程
多种性能特征(pc)是现代产品结构复杂、功能多样的普遍现象。这些pc通常是相互依赖的,在多变量退化过程中具有显著的单元特异性可变性。因此,对相关的多元退化过程进行相关的退化建模是很重要的。为此,本文提出了一种新的多元$t$退化模型。具体而言,多变量退化过程之间的依赖关系由遵循多变量正态分布的随机漂移参数捕获,而扩散参数和方差-协方差的变化则以伽马分布为特征。采用期望最大化(EM)算法进行似然推断,采用正态逼近和自举法构造模型参数的置信区间。对多元退化建模中模型错配的影响进行了理论探讨。蒙特卡罗仿真研究验证了EM算法的有效性和多元$t$模型的理论性质。最后,通过两个实例说明了所提方法的适用性和优越性。
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来源期刊
IEEE Transactions on Reliability
IEEE Transactions on Reliability 工程技术-工程:电子与电气
CiteScore
12.20
自引率
8.50%
发文量
153
审稿时长
7.5 months
期刊介绍: IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.
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