{"title":"Eco-friendly water-induced lithium oxide/polyethyleneimine ethoxylated as a possible gate dielectric of the organic field effect transistor","authors":"Ali Bahari","doi":"10.1007/s10854-024-13391-w","DOIUrl":null,"url":null,"abstract":"<p>It seems impossible to use silicon oxide as a suitable gate dielectric material in metal-oxide-semiconductor field effect transistors. Many researchers have studied various metal oxides, nitrides, composite, and hybrid materials in search of dielectric materials that can replace silicon oxide. Each of these materials has advantages and disadvantages. In the present work, water-induced Lithium oxide (LiO<sub>x</sub>) with the organic PEIE (polyethylene imine ethoxylated) materials has been synthesized and studied. One advantage of the present work is using deionized water for getting (LiO<sub>x</sub>) precursor solution from lithium nitrate without the use of any toxic additives, resulting in a low cost-effective and eco-friendly synthesis. By fabricating three organic field effect transistors (OFETs) with LiO<sub>x</sub>/ PEIE nanocomposite materials with the same weight ratio (1:1), desirable electrical characteristics such as higher carrier mobility (μ) of 47.3 cm<sup>2</sup>V<sup>−1</sup> S<sup>−1</sup> , higher on-off current ratio (Ion/Ioff) of ∼10<sup>5</sup> , minima threshold voltage (V<sub>th</sub>) shift of ∼ 0.6 (±0.2) V, lower subthreshold swing (SS) of 3.12 mV/decade and lower tunneling-, and leakage current density (J) of 2 (nA/cm<sup>2</sup>) could be found which demonstrated eco-friendly water-induced LiO<sub>x</sub>/ PEIE can be used as an alternative gate dielectric for the future of the OFET devices.</p>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1007/s10854-024-13391-w","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
It seems impossible to use silicon oxide as a suitable gate dielectric material in metal-oxide-semiconductor field effect transistors. Many researchers have studied various metal oxides, nitrides, composite, and hybrid materials in search of dielectric materials that can replace silicon oxide. Each of these materials has advantages and disadvantages. In the present work, water-induced Lithium oxide (LiOx) with the organic PEIE (polyethylene imine ethoxylated) materials has been synthesized and studied. One advantage of the present work is using deionized water for getting (LiOx) precursor solution from lithium nitrate without the use of any toxic additives, resulting in a low cost-effective and eco-friendly synthesis. By fabricating three organic field effect transistors (OFETs) with LiOx/ PEIE nanocomposite materials with the same weight ratio (1:1), desirable electrical characteristics such as higher carrier mobility (μ) of 47.3 cm2V−1 S−1 , higher on-off current ratio (Ion/Ioff) of ∼105 , minima threshold voltage (Vth) shift of ∼ 0.6 (±0.2) V, lower subthreshold swing (SS) of 3.12 mV/decade and lower tunneling-, and leakage current density (J) of 2 (nA/cm2) could be found which demonstrated eco-friendly water-induced LiOx/ PEIE can be used as an alternative gate dielectric for the future of the OFET devices.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.