Impact of Pd2+ and Sn4+ co-doping ZnO nanoflakes toward high-performing Schottky diode based on the generation of intermediate bands within the energy gap

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-09-09 DOI:10.1007/s10854-024-13398-3
Elsayed Elgazzar
{"title":"Impact of Pd2+ and Sn4+ co-doping ZnO nanoflakes toward high-performing Schottky diode based on the generation of intermediate bands within the energy gap","authors":"Elsayed Elgazzar","doi":"10.1007/s10854-024-13398-3","DOIUrl":null,"url":null,"abstract":"<div><p>Pd:Sn/ZnO nanohybrid was prepared by chemical co-precipitation route and identified using XRD, EDX, SEM, and TEM techniques. The microstructure analysis emphasized the polycrystalline nature in which Pd and Sn ions were substituted inside ZnO framework to form the nanocomposite. The surface morphology was appeared in 2D nanoflakes with large specific surface area. The optical parameters including <i>E</i><sub>g</sub>, <i>n</i>, and <i>k</i> were deduced from T% and R% spectra through wavelength range 300–1400 nm. The thin film showed strong optical absorption inside the UV region with a value of <i>E</i><sub>g</sub> = 3.10 eV. The Ag/Pd:Sn/ZnO/p-Si/Al Schottky diode was fabricated by thermal evaporation technique, and its electronic and photodetector properties were investigated from I–V and C–V measurements. The fabricated device exhibited non-ideal behavior with high rectification ratio RR = 935 and a relatively small <i>R</i><sub>s</sub> lies between 2365 and 2755 Ω. Under illumination impacts, the photodiode exhibited high photosensitivity and responsivity attributed to the large photo-induced charge carriers.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10854-024-13398-3.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13398-3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

Pd:Sn/ZnO nanohybrid was prepared by chemical co-precipitation route and identified using XRD, EDX, SEM, and TEM techniques. The microstructure analysis emphasized the polycrystalline nature in which Pd and Sn ions were substituted inside ZnO framework to form the nanocomposite. The surface morphology was appeared in 2D nanoflakes with large specific surface area. The optical parameters including Eg, n, and k were deduced from T% and R% spectra through wavelength range 300–1400 nm. The thin film showed strong optical absorption inside the UV region with a value of Eg = 3.10 eV. The Ag/Pd:Sn/ZnO/p-Si/Al Schottky diode was fabricated by thermal evaporation technique, and its electronic and photodetector properties were investigated from I–V and C–V measurements. The fabricated device exhibited non-ideal behavior with high rectification ratio RR = 935 and a relatively small Rs lies between 2365 and 2755 Ω. Under illumination impacts, the photodiode exhibited high photosensitivity and responsivity attributed to the large photo-induced charge carriers.

Abstract Image

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于能隙内中间带的产生,Pd2+ 和 Sn4+ 共掺杂 ZnO 纳米片对高性能肖特基二极管的影响
钯:锡/氧化锌纳米杂化物是通过化学共沉淀路线制备的,并使用 XRD、EDX、SEM 和 TEM 技术进行了鉴定。微观结构分析表明,钯和锡离子在 ZnO 框架内取代形成了纳米复合材料的多晶性质。表面形貌呈现出具有较大比表面积的二维纳米片。通过波长范围为 300-1400 nm 的 T% 和 R% 光谱,推导出了包括 Eg、n 和 k 在内的光学参数。薄膜在紫外区表现出强烈的光吸收,Eg = 3.10 eV。利用热蒸发技术制作了 Ag/Pd:Sn/ZnO/p-Si/Al 肖特基二极管,并通过 I-V 和 C-V 测量研究了其电子和光电探测器特性。在光照影响下,该光电二极管表现出很高的光敏度和响应度,这归功于大量的光诱导电荷载流子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
期刊最新文献
Chemical combustion synthesis of CeO2–ZnO nanocomposite and its application in ethanol sensing Enhanced performance of perovskite solar cells using ZnO electron transport layer prepared under simultaneous UV irradiation and magnetic field Boosting energy storage properties of BNT-based relaxor ferroelectric ceramics via (Zn1/3Nb2/3)4+ complex ion doping Flexible metal-polymer electromagnetic shielding composite sealant for underground defensive structures Investigation on growth, structural, spectral, optical, thermal, third order nonlinear optical and DFT studies of dibenzoylmethane single crystal for photonic and optoelectronic applications
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1