Qi Liu , Ming Ling , Yanxiang Zhu , Yibo Rui , Rui Wang
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引用次数: 0
Abstract
This paper introduces a comprehensive predictive framework utilizing a Support Vector Machine (SVM) classifier to prevent short violations in clock routing prior to powerplanning and placement. Leveraging complex patterns in power mesh configurations and relevant features, the framework enables the SVM classifier to achieve at least 82.6% F1-score and 82.0% accuracy across five cross-tests with open-source benchmarks. The SVM classifier also demonstrates its capability to predict whether short violations will occur in clock routing, effectively selecting nearly or more than 1/2 of the original 150 instances in each of the five benchmarks, resulting in relatively fewer Design Rule Check (DRC) violations after all routing. Moreover, across five cross-tests with 150 instances per benchmark, the classifier filters out at least 1/3 of the configurations vulnerable to clock routing short violations, thereby saving the operational time otherwise required for these configurations.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.