Preventing short violations in clock routing with an SVM classifier before powerplanning and placement

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 2024-10-05 DOI:10.1016/j.mejo.2024.106429
Qi Liu , Ming Ling , Yanxiang Zhu , Yibo Rui , Rui Wang
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Abstract

This paper introduces a comprehensive predictive framework utilizing a Support Vector Machine (SVM) classifier to prevent short violations in clock routing prior to powerplanning and placement. Leveraging complex patterns in power mesh configurations and relevant features, the framework enables the SVM classifier to achieve at least 82.6% F1-score and 82.0% accuracy across five cross-tests with open-source benchmarks. The SVM classifier also demonstrates its capability to predict whether short violations will occur in clock routing, effectively selecting nearly or more than 1/2 of the original 150 instances in each of the five benchmarks, resulting in relatively fewer Design Rule Check (DRC) violations after all routing. Moreover, across five cross-tests with 150 instances per benchmark, the classifier filters out at least 1/3 of the configurations vulnerable to clock routing short violations, thereby saving the operational time otherwise required for these configurations.
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在电源规划和布局前使用 SVM 分类器防止时钟布线中的短路现象
本文介绍了一个综合预测框架,利用支持向量机(SVM)分类器在电源规划和布局之前防止时钟路由中的短路现象。利用电源网格配置中的复杂模式和相关特征,该框架使 SVM 分类器在与开源基准进行的五次交叉测试中取得了至少 82.6% 的 F1 分数和 82.0% 的准确率。SVM 分类器还展示了其预测时钟布线中是否会出现短路违规的能力,在五个基准中的每个基准中,SVM 分类器都有效地选择了近 1/2或更多的原始 150 个实例,从而在所有布线后减少了相对较少的设计规则检查(DRC)违规。此外,在每个基准 150 个实例的五次交叉测试中,分类器至少过滤掉了 1/3 容易发生时钟路由短违规的配置,从而节省了这些配置所需的运行时间。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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