Gang Li , Xilong Shao , Pengjun Wang , Xuejiao Ma , Hui Li , Hao Ye
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引用次数: 0
Abstract
Physical unclonable functions (PUF) have significant potential for application in information security. However, strong PUFs are vulnerable to machine learning (ML) modeling attacks, which severely limit their application in device authentication. Despite a variety of resistance techniques, strong PUFs suffer from hardware cost and stability deficiencies. This study proposes an anti-machine-learning-attack strong PUF based on a multi-path delay selection strategy through research on the entropy source of a strong PUF and the delay signal selection mechanism. First, we constructed a deviation source circuit based on multiplexers to increase the diversity of the delay signal transmission paths. Second, we constructed a delay selection circuit based on the logic gates. This circuit dynamically selects the delay signals with the same transmission path in the deviation source using AND and OR gates. Subsequently, the deviation source and delay selection circuits were utilized to construct the delay module, and the interconnection module was inserted between the delay modules to achieve alternating appearances of different types of logic gates along the delay path. Finally, RS flip-flops were employed to make decisions on the bias signals with the same delay path, and the final response was output through an XOR operation. The proposed PUF was implemented on a Xilinx Artix-7 FPGA, and the prediction accuracy of the four typical ML models was below 59 % (with 500,000 challenge-response pairs as the training set). Moreover, the proposed PUF structure is scalable and exhibits better performance in terms of hardware cost and stability than existing classic structures.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.