Thermoluminescence properties of Cr, Si, and Mg co-doped Al2O3 ceramics plates under X-ray irradiation

IF 2.8 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-01-11 DOI:10.1007/s10854-024-14198-5

Kiyomitsu Shinsho, Natsumi Sugioka, Ayaka Yamazaki, Ema Sasaki, Go Okada, Weishan Chang, Yutaro Mori, Ayano Okubo, Toru Negishi, Yusuke Koba

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Abstract

The thermoluminescence (TL) properties and precise dose distribution measurement capabilities of Cr, Si, and Mg co-doped Al₂O₃ ceramics (Al₂O₃:Cr,Si,Mg) plates were investigated under X-ray irradiation. The co-doping of Si and Mg significantly enhanced the TL sensitivity, approximately doubling it compared to conventional Al₂O₃:Cr plates, due to the creation of new trapping levels. The TL dose response was proportional in the dose range of 0.5 to 5 Gy, and off-axis ratio (OAR) measurements confirmed the high spatial resolution and accuracy of the plates to reproduce the radiation distributions. This study is the first to evaluate TL plates of this size (200 × 200 mm²) that utilize Al₂O₃ as the host material, and demonstrate their significant potential for radiotherapy dosimetry systems. This significant contribution highlights the potential of Al₂O₃:Cr,Si,Mg ceramic plates to transform dosimetry systems for radiotherapy by providing a combination of high sensitivity, spatial resolution, and robustness. The results of this study lay the groundwork for the development and practical application of large-area TL imaging devices in medical dose verification.

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Cr、Si、Mg共掺杂Al2O3陶瓷板在x射线照射下的热释光性能

研究了Cr、Si、Mg共掺杂Al2O3陶瓷（Al2O3:Cr、Si、Mg）板在x射线照射下的热释光（TL）性能和精确剂量分布测量能力。由于产生了新的捕获水平，Si和Mg的共掺杂显著提高了TL灵敏度，与传统的Al2O3:Cr板相比，其灵敏度大约增加了一倍。在0.5 ~ 5 Gy的剂量范围内，TL剂量响应成正比，离轴比（OAR）测量证实了板的高空间分辨率和精度来再现辐射分布。这项研究首次评估了这种尺寸（200 × 200 mm2）的利用Al2O3作为宿主材料的TL板，并证明了它们在放射剂量测定系统中的重要潜力。这一重大贡献突出了Al2O3:Cr，Si，Mg陶瓷板的潜力，通过提供高灵敏度，空间分辨率和鲁棒性的组合来改变放射治疗剂量测定系统。本研究结果为大面积TL成像装置在医疗剂量验证中的开发和实际应用奠定了基础。

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来源期刊

Journal of Materials Science: Materials in Electronics 工程技术-材料科学：综合

CiteScore

5.00

自引率

7.10%

发文量

1931

审稿时长

2 months

期刊介绍： The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.