Tunable capacitive resistance switching with low-power synaptic bionic potential in (1–x)Bi0.88Nd0.12FeO3–xCaBi4Ti4O15 thin films

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-01-14 DOI:10.1007/s10854-024-14205-9
Wenlong Liu, Jin Zong, Di Li, Jiahua Wei, Guoqiang Tan, Qibin Yuan, Dinghan Liu, Ao Xia
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Abstract

A memristor with a low power consumption, non-volatility, and adaptive abilities complex has a promising prospect in neural network computing systems due to its unique nonlinearity, memory, and local activity. Here, the Au/(1-x)Bi0.88Nd0.12FeO3-xCaBi4Ti4O15 (BNFO-CBTO, x = 0.1, 0.2, 0.3, 0.4, 0.5) non-volatile memory devices with resistance-switching (RS) behaviors are fabricated by sol–gel method. The (1-x) BNFO-xCBTO samples exhibit a tunable capacitive resistive switching behavior by the CBTO phase, i.e., the higher the content of the CBTO phase, the more obvious the phenomenon of capacitive resistance-switching behavior. Moreover, the CBTO phase improves the cyclic fatigue characteristics of the (1–x)BNFO–xCBTO samples. The lowest operating current (~ 1nA-100nA) is observed in the 0.6BNFO-0.4CBTO sample. Further, the multiple resistance states, conductive mechanisms, and synaptic behaviors with conductance continuous modulation, paired-pulse facilitation (PPF) behaviors, and excitatory postsynaptic current (EPSC) are also simulated. The 0.6BNFO-0.4CBTO non-volatile memory device with tunable abnormal resistance switching, low-power synaptic bionic potential, and a series of synaptic-like behaviors can provide a new opportunity to apply the RS behavior in high-performance computing with low power consuming, brain-like neuromorphic mimicry, and next-generation information-storage devices.

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(1-x) Bi0.88Nd0.12FeO3-xCaBi4Ti4O15薄膜中具有低功耗突触仿生电位的可调电容电阻开关
具有低功耗、无易失性和自适应能力的忆阻器由于其独特的非线性、记忆性和局部活动性,在神经网络计算系统中具有广阔的应用前景。本文采用溶胶-凝胶法制备了Au/(1-x)Bi0.88Nd0.12FeO3-xCaBi4Ti4O15 (BNFO-CBTO, x = 0.1, 0.2, 0.3, 0.4, 0.5)具有电阻开关(RS)行为的非易失性存储器件。(1-x) BNFO-xCBTO样品通过CBTO相表现出可调的容阻开关行为,即CBTO相含量越高,其容阻开关行为越明显。此外,CBTO相改善了(1-x) bfo - xcbto样品的循环疲劳特性。在0.6 bfo -0.4 cbto样品中观察到最低的工作电流(~ 1nA-100nA)。此外,还模拟了电导连续调制下的多种电阻状态、导电机制和突触行为、配对脉冲促进(PPF)行为和兴奋性突触后电流(EPSC)。具有可调异常电阻开关、低功耗突触仿生电位和一系列类突触行为的0.6 bfo -0.4 cbto非易失性存储器件为RS行为在低功耗高性能计算、类脑神经形态模拟和下一代信息存储器件中的应用提供了新的机会。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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