Wenlong Liu, Jin Zong, Di Li, Jiahua Wei, Guoqiang Tan, Qibin Yuan, Dinghan Liu, Ao Xia
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引用次数: 0
Abstract
A memristor with a low power consumption, non-volatility, and adaptive abilities complex has a promising prospect in neural network computing systems due to its unique nonlinearity, memory, and local activity. Here, the Au/(1-x)Bi0.88Nd0.12FeO3-xCaBi4Ti4O15 (BNFO-CBTO, x = 0.1, 0.2, 0.3, 0.4, 0.5) non-volatile memory devices with resistance-switching (RS) behaviors are fabricated by sol–gel method. The (1-x) BNFO-xCBTO samples exhibit a tunable capacitive resistive switching behavior by the CBTO phase, i.e., the higher the content of the CBTO phase, the more obvious the phenomenon of capacitive resistance-switching behavior. Moreover, the CBTO phase improves the cyclic fatigue characteristics of the (1–x)BNFO–xCBTO samples. The lowest operating current (~ 1nA-100nA) is observed in the 0.6BNFO-0.4CBTO sample. Further, the multiple resistance states, conductive mechanisms, and synaptic behaviors with conductance continuous modulation, paired-pulse facilitation (PPF) behaviors, and excitatory postsynaptic current (EPSC) are also simulated. The 0.6BNFO-0.4CBTO non-volatile memory device with tunable abnormal resistance switching, low-power synaptic bionic potential, and a series of synaptic-like behaviors can provide a new opportunity to apply the RS behavior in high-performance computing with low power consuming, brain-like neuromorphic mimicry, and next-generation information-storage devices.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.