Enhancing Broadband 4H-SiC Photodetectors With Gold Nanoparticles: Expanding Sensitivity From UV to SWIR Spectrum

IF 3.2 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electron Devices Pub Date : 2025-01-07 DOI:10.1109/TED.2024.3522213
Lulu Geng;Guohui Li;Wenbin Sun;Xianyong Yan;Wenyan Wang;Ting Ji;Zhihui Chen;Kaili Mao;Yuan Tian;Yanxia Cui
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Abstract

4H-silicon carbide (4H-SiC) is promising for photodetectors (PDs) capable of operating at high voltages and elevated temperatures. However, the wide bandgap of 4H-SiC (3.26 eV) restricts its applications to the ultraviolet (UV) range below 400 nm. It is essential to develop 4H-SiC PDs with a broadband response covering the UV to short-wavelength infrared (SWIR) spectrum. This study demonstrates a 4H-SiC broadband PD with sensitivity extending from UV to SWIR range up to 2200 nm. The superior performance is attributed to the presence of numerous defect centers forming deep energy levels within the 4H-SiC bandgap, which allows the absorption of visible (VIS) and SWIR photons with energies lower than the bandgap. Moreover, the incorporation of thermally annealed gold nanoparticles (Au NPs) induces localized plasmonic resonance, significantly enhancing the photocurrent over a broadband wavelength range while maintaining the dark current. This leads to superior weak light detection capabilities for the plasmonic device compared to the reference device without Au NPs. At the enhancement peak (under 860-nm laser illumination), the plasmonic device achieves a minimum detectable power density of $0.488~\mu $ W/cm2. Notably, the plasmonic PD exhibits a 3260% increase in the photo-to-dark current ratio (PDCR), with an external quantum efficiency (EQE) enhancement factor reaching a maximum of 3166%. These results lay a foundation for advancing the development of UV-SWIR broadband SiC PDs.
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用金纳米粒子增强宽带4H-SiC光电探测器:扩展从紫外到SWIR光谱的灵敏度
4h -碳化硅(4H-SiC)有望用于能够在高压和高温下工作的光电探测器(pd)。然而,4H-SiC的宽禁带(3.26 eV)限制了其应用于400 nm以下的紫外(UV)范围。开发具有覆盖紫外到短波红外(SWIR)光谱的宽带响应的4H-SiC pd至关重要。该研究展示了一种4H-SiC宽带PD,其灵敏度从紫外到SWIR范围延伸至2200 nm。优异的性能是由于在4H-SiC带隙内存在许多形成深能级的缺陷中心,这使得吸收能量低于带隙的可见光(VIS)和SWIR光子成为可能。此外,热退火金纳米颗粒(Au NPs)的掺入诱导了局部等离子体共振,在保持暗电流的同时显著增强了宽带波长范围内的光电流。与没有Au NPs的参考器件相比,这导致等离子体器件具有优越的弱光检测能力。在增强峰(860 nm激光照射下),等离子体器件的最小可探测功率密度为0.488~\mu $ W/cm2。值得注意的是,等离子体PD的光暗电流比(PDCR)提高了3260%,外量子效率(EQE)增强因子达到了最大值3166%。这些结果为推进紫外- swir宽带SiC器件的发展奠定了基础。
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来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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