A chaotic strong transition effect ring oscillator PUF with effective immunity to modeling attacks

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 2025-02-07 DOI:10.1016/j.mejo.2025.106592
Jingchang Bian, Xingchen Du, Yingchun Lu, Aibin Yan, Huaguo Liang, Zhengfeng Huang
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Abstract

Although the rapid development of information technology has brought unprecedented convenience and revolutionary changes to human lifestyles, it has also led to serious privacy and security issues. Massive amounts of sensitive information are exchanged within cyber-physical systems (CPS), and the storage and authentication processes of this information are highly susceptible to the attention of malicious attackers. Strong physical unclonable function (PUF) is a crucial hardware security primitive for identity authentication in lightweight internet of things (IoT) devices. However, most of the existing strong PUFs have failed to resist advanced modeling attacks based on machine learning. The paper proposes a chaotic strong transition effect ring oscillator (CS-TERO) PUF, which combines the nonlinearity of strong TERO and the unpredictability of chaotic design to resist modeling attacks. The strong PUF feature is achieved through configurable dual XOR gates and extended TERO chains. Chaotic operations are performed by obfuscating challenges using logical mapping functions. Experimental results demonstrate that the CS-TERO PUF successfully resists state-of-the-art modeling attacks, and the accuracy of all attacks is below 70 %. Compared to other modeling attack-resilient PUFs, our CS-TERO PUF requires fewer hardware resources, saving almost 25 % of area overhead compared to the most lightweight solutions. Additionally, the CS-TERO PUF demonstrates a reliability of 98.27 %, uniqueness of 53.65 %, and uniformity of 49.26 %, reaching an advanced strong PUF application standard. Furthermore, the randomness has also passed the internationally accredited NIST 800-22 S P test.
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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