{"title":"Effects of proton irradiation on microstructure and mechanical properties of SAC305 solder joints","authors":"Yang Liu, Mengxia Jiang, Yangjing Xia, Xuewei Zhao, Fanchen Meng, Nannan Li, Chaoyang Xing, Yuxiong Xue","doi":"10.1007/s10854-025-14516-5","DOIUrl":null,"url":null,"abstract":"<div><p>The space environment is subject to various cosmic rays and high-energy particles, which inevitably causes damage to space-borne equipment, posing a threat to the safety and reliability of spacecraft operation. As a critical part of interconnection in electronic components, it is of great significance to study the reliability of solder joints under radiation conditions. A combination of experimental and simulation methods was employed to study the microstructure and mechanical properties of SAC305 solder joints under 30 MeV proton irradiation, and the interaction mechanism between protons and solder joints was analyzed. The findings indicate that the high-energy protons penetrate the solder joints with little scattering and directly engage in nuclear reactions, leading to lattice defects and an increase of dislocation density. Although no defects such as voids and cracks were observed at the micron scale, the decrease of grain size at the nanoscale and the existence of cell compressive stress reduced the lattice quality and weakened interatomic bonding, resulting in a decrease of the shear strength in solder joints. At a proton fluence of 1E11 p/cm2, the shear strength of the solder joint decreased by 9.8% compared with the unirradiated state.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 7","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-14516-5","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The space environment is subject to various cosmic rays and high-energy particles, which inevitably causes damage to space-borne equipment, posing a threat to the safety and reliability of spacecraft operation. As a critical part of interconnection in electronic components, it is of great significance to study the reliability of solder joints under radiation conditions. A combination of experimental and simulation methods was employed to study the microstructure and mechanical properties of SAC305 solder joints under 30 MeV proton irradiation, and the interaction mechanism between protons and solder joints was analyzed. The findings indicate that the high-energy protons penetrate the solder joints with little scattering and directly engage in nuclear reactions, leading to lattice defects and an increase of dislocation density. Although no defects such as voids and cracks were observed at the micron scale, the decrease of grain size at the nanoscale and the existence of cell compressive stress reduced the lattice quality and weakened interatomic bonding, resulting in a decrease of the shear strength in solder joints. At a proton fluence of 1E11 p/cm2, the shear strength of the solder joint decreased by 9.8% compared with the unirradiated state.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.