Effects of proton irradiation on microstructure and mechanical properties of SAC305 solder joints

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-03-08 DOI:10.1007/s10854-025-14516-5
Yang Liu, Mengxia Jiang, Yangjing Xia, Xuewei Zhao, Fanchen Meng, Nannan Li, Chaoyang Xing, Yuxiong Xue
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Abstract

The space environment is subject to various cosmic rays and high-energy particles, which inevitably causes damage to space-borne equipment, posing a threat to the safety and reliability of spacecraft operation. As a critical part of interconnection in electronic components, it is of great significance to study the reliability of solder joints under radiation conditions. A combination of experimental and simulation methods was employed to study the microstructure and mechanical properties of SAC305 solder joints under 30 MeV proton irradiation, and the interaction mechanism between protons and solder joints was analyzed. The findings indicate that the high-energy protons penetrate the solder joints with little scattering and directly engage in nuclear reactions, leading to lattice defects and an increase of dislocation density. Although no defects such as voids and cracks were observed at the micron scale, the decrease of grain size at the nanoscale and the existence of cell compressive stress reduced the lattice quality and weakened interatomic bonding, resulting in a decrease of the shear strength in solder joints. At a proton fluence of 1E11 p/cm2, the shear strength of the solder joint decreased by 9.8% compared with the unirradiated state.

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质子辐照对SAC305焊点组织和力学性能的影响
空间环境受到各种宇宙射线和高能粒子的影响,不可避免地会对星载设备造成损坏,对航天器运行的安全可靠性构成威胁。作为电子元件互连的关键部分,研究辐射条件下焊点的可靠性具有重要意义。采用实验与模拟相结合的方法,研究了30 MeV质子辐照下SAC305焊点的显微组织和力学性能,并分析了质子与焊点的相互作用机理。结果表明:高能质子以较小的散射穿透焊点,直接参与核反应,导致点阵缺陷和位错密度增加;虽然在微米尺度上没有观察到空洞和裂纹等缺陷,但纳米尺度上晶粒尺寸的减小和单元压应力的存在降低了点阵质量,削弱了原子间键合,导致焊点抗剪强度下降。当质子通量为1E11 p/cm2时,焊点的抗剪强度比未辐照状态降低了9.8%。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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