Y. Yamaga, Yoshiaki Deguchi, S. Fukuyama, K. Takeuchi
{"title":"5x Reliability Enhanced 40nm TaOx Approximate-ReRAM with Domain-Specific Computing for Real-time Image Recognition of IoT Edge Devices","authors":"Y. Yamaga, Yoshiaki Deguchi, S. Fukuyama, K. Takeuchi","doi":"10.1109/VLSIT.2018.8510669","DOIUrl":null,"url":null,"abstract":"Highly reliable Approximate-ReRAM (A-ReRAM) with Pixel-to-Pixel Data Matching (P2P-DM) and Inter-Pixel error-correcting code (IP-ECC) is proposed to recognize the image accurately by deep neural network (DNN). By specializing for the image recognition applications and modulating the image data based on pixel-to-pixel features and ReRAM error characteristics, data-retention time and endurance of ReRAM increases by 5x and 3.3x, respectively.","PeriodicalId":6561,"journal":{"name":"2018 IEEE Symposium on VLSI Technology","volume":"26 1","pages":"109-110"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2018.8510669","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Highly reliable Approximate-ReRAM (A-ReRAM) with Pixel-to-Pixel Data Matching (P2P-DM) and Inter-Pixel error-correcting code (IP-ECC) is proposed to recognize the image accurately by deep neural network (DNN). By specializing for the image recognition applications and modulating the image data based on pixel-to-pixel features and ReRAM error characteristics, data-retention time and endurance of ReRAM increases by 5x and 3.3x, respectively.