A Threshold Switch Augmented Hybrid-FeFET (H-FeFET) with Enhanced Read Distinguishability and Reduced Programming Voltage for Non-Volatile Memory Applications

M. Jerry, A. Aziz, K. Ni, S. Datta, S. Gupta, N. Shukla
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引用次数: 12

Abstract

In this work, we demonstrate a novel Hybrid-FeFET (H-FeFET) that leverages the threshold switching characteristics of Ag/HfO2 to overcome the fundamental trade-off between memory window MW /read current ratio (Iread,1/Iread,0) , and program voltage (Vprog)/maximum electric-field in standard FeFETs for non-volatile memory application. The H-FeFET incorporates the threshold switch (TS) in the source of the FeFET, and is designed to exhibit a ferroelectric state-dependent volatile HRS to LRS transition (ION/IOFF >107) – during read, the TS turns ON only if the FeFET is in the low-VT SET state, and remains OFF if the FeFET is in the high-VT RESET state, thus, selectively suppressing the RESET read current. Leveraging this principle, the H-FeFET: a Demonstrates 77% higher MW and 1000× larger Iread,1/Iread,0 compared to the FeFET, at iso-Vprog (DC); (b) Enables 25% reduction in Vprog at iso-Iread,1/Iread,0 during pulse operation-facilitated by the 8× improvement in Iread,1/Iread,0; (c) Exhibits 2.5×reduction in programming power at iso-Iread,1/Iread,0 in the H-FeFET-based AND array architecture, as shown by simulations. Thus, the H-FeFET overcomes the FeFET design challenges while retaining its existing advantages, making it a promising candidate for nonvolatile memory applications.
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一种用于非易失性存储器的阈值开关增强混合ffet (h - ffet),具有增强的读可分辨性和降低的编程电压
在这项工作中,我们展示了一种新的混合ffet (h - ffet),它利用Ag/HfO2的阈值开关特性来克服标准ffet中用于非易失性存储器应用的存储器窗口MW /读取电流比(Iread,1/Iread,0)和程序电压(Vprog)/最大电场之间的基本权衡。h- ffet在ffet源中集成了阈值开关(TS),并设计为具有铁电状态相关的易失性HRS到LRS跃迁(ION/IOFF >107) -在读取期间,TS仅在ffet处于低vt SET状态时打开,并且在ffet处于高vt RESET状态时保持关闭,因此,选择性地抑制RESET读电流。利用这一原理,在iso-Vprog (DC)下,与ffet相比,h - ffet的MW提高了77%,Iread (1/Iread,0)提高了1000倍;(b)在脉冲操作过程中,在iso-Iread,1/Iread,0下使Vprog降低25%,这得益于Iread,1/Iread,0提高了8倍;(c)模拟显示,基于h - fet的AND阵列结构在iso-Iread,1/Iread,0时的编程能力2.5×reduction。因此,h - ffet在保留其现有优势的同时克服了ffet设计挑战,使其成为非易失性存储器应用的有希望的候选者。
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