Design of testing chip for measuring mechanical properties of thin films

Rui Liu, Hong Wang, Xueping Li, Jun Tang, Shengping Mao, G. Ding
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Abstract

Uniaxial tensile test is the most reliable way to measure mechanical properties of thin films. The difficulties of uniaxial tensile test are how to fabricate small and stress-free specimen, align and trip the specimen, generate small forces and measure strain. A novel tensile testing chip to measure thin film specimens with large elongation was proposed in this paper, and it was fabricated by UV-LIGA (Ultraviolet Lithographie GalVanoformung Abformung) technology. This novel testing chip has good alignment and can endure large deformation.
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薄膜力学性能测试芯片的设计
单轴拉伸试验是测量薄膜力学性能最可靠的方法。单轴拉伸试验的难点在于如何制作小而无应力的试样、试样对准和脱扣、产生小的力和测量应变。提出了一种用于测量大伸长率薄膜试样的新型拉伸测试芯片,并采用UV-LIGA (Ultraviolet Lithographie GalVanoformung Abformung)技术制作了该芯片。这种新型测试芯片具有良好的对准性,能够承受较大的变形。
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