Strain Rate Sensitivity of Mixed SAC-SnBi Solder Joints

L. Wentlent, J. Wilcox, Xuanyi Ding
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Abstract

As the electronics industry continues to evolve a concerted effort has developed to implement lower melting point solders. The ability to minimize the thermal exposure that an assembly is subjected to affords significant benefits with respect to both the reliability and the materials that can be used. One of the most popular low melt solder alloys currently being investigated by the industry is the Bi-Sn eutectic system, which has a melting point of 139°C. The BiSn system itself is not particularly novel as it was posited as a SAC alternative during the initial shift from Pb based solders. While a body of knowledge currently exists regarding this system, and the near eutectic variant BiSnAg, there are still concerns regarding its ductility, especially as a function of thermal exposure and strain rate. Bismuth is widely acknowledged as a brittle element and its presence in such quantities raises concerns of not just Cu6Sn5 embrittlement but also solder fragility in high strain rate types of environments. A challenge with regards to near term implementation is that most packages are not available with BiSn solder bumps. Therefore, it will be necessary to use components already balled with SAC 305 solder. This means that the resulting solder interconnect, reflowed below conventional SAC reflow temperatures, will form a type of mixed hybrid microstructure. This non-equilibrium microstructure will be composed of two regions, one Bi-rich region which is well past saturation and a second region which is Bi-deficient. It is of specific industrial interest then to not just investigate the BiSn solder system but also within the context of a realistic mixed interconnect. Recent work by several researchers has shown that this hybrid microstructure is unstable and quite active with respect to the movement and localized concentration of the Bismuth. The degree of mixing of these two regions has been shown to be highly dependent upon reflow temperature and the paste to ball volume ratio. Mixed SAC-BiSn solder joints were formed by placing SAC 305 spheres on BiSn paste deposits for a paste to ball volume ratio of .18. These samples were then reflowed at either 175°C or 200°C. SAC 305 control samples were also made using a conventional Pb-free reflow profile with a peak temperature of 247°C. A 22 mil Cu-OSP pad on a 1.0 mm thick FR4 substrate was used for all samples. A selection of the solder joints were then isothermally aged at 90°C for 200 hours. Using a joint level micromechanical tester, ball shear tests were conducted at a range of strain rates for samples in the as-reflowed and aged state. Using this information, the strain rate sensitivity of the interconnects was mapped and correlated with the observed failure modes. Investigations into the fracture mechanisms were conducted by examining the shear fracture surface with optical and scanning electron microscopy. Additionally, the evolution of the microstructure was characterized. Results showed a clear transition from ductile solder failure to a brittle separation failure at the higher strain rates.
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SAC-SnBi混合焊点应变速率敏感性研究
随着电子工业的不断发展,一种协调一致的努力已经发展到实施低熔点焊料。能够最大限度地减少组件的热暴露,在可靠性和可使用的材料方面都有显著的好处。目前业界正在研究的最流行的低熔点焊料合金之一是Bi-Sn共晶系统,其熔点为139°C。BiSn系统本身并不是特别新颖,因为在最初从Pb基焊料转变为SAC的过程中,它被认为是SAC的替代品。虽然目前已有关于该体系和近共晶型BiSnAg的知识体系,但其延展性,特别是作为热暴露和应变率的函数,仍然令人担忧。铋被广泛认为是一种脆性元素,它的大量存在不仅引起了Cu6Sn5脆化的担忧,而且引起了高应变率环境下焊料的易损性。关于近期实现的一个挑战是,大多数封装不具有BiSn焊料凸起。因此,有必要使用已经用SAC 305焊料球化的组件。这意味着所得到的焊料互连,再流低于常规SAC再流温度,将形成一种混合的混合微观结构。这种非平衡微观结构将由两个区域组成,一个是远超过饱和的富bi区域,另一个是缺bi区域。因此,不仅要研究BiSn焊料系统,而且要在实际混合互连的背景下进行研究,这是具有特定工业利益的。最近几位研究人员的工作表明,这种杂化微观结构是不稳定的,并且在铋的运动和局部浓度方面相当活跃。这两个区域的混合程度已被证明高度依赖于回流温度和膏体与球的体积比。通过将SAC 305球体放置在BiSn膏体沉积层上,形成SAC-BiSn混合焊点,膏体与球的体积比为0.18。然后将这些样品在175°C或200°C下回流。SAC 305对照样品也采用传统的无铅回流曲线,峰值温度为247°C。所有样品均使用1.0 mm厚FR4衬底上的22 mil Cu-OSP衬垫。然后选择焊点在90°C下等温时效200小时。采用节理级微力学试验机,对试样在回流状态和时效状态下进行了不同应变速率下的球剪试验。利用这些信息,绘制了互连的应变率灵敏度,并将其与观察到的破坏模式相关联。利用光学显微镜和扫描电镜对剪切断口进行了断裂机理研究。此外,还对微观组织的演变进行了表征。结果表明,在较高的应变速率下,从延展性焊接失效到脆性分离失效有明显的转变。
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