Effects of the Curing Properties and Viscosities of Non-Conductive Films (NCFs) on the Sn-Ag Solder Bump Joint Morphology and Reliability

Hanmin Lee, Seyong Lee, Sangmyung Shin, Taejin Choi, SooIn Park, K. Paik
{"title":"Effects of the Curing Properties and Viscosities of Non-Conductive Films (NCFs) on the Sn-Ag Solder Bump Joint Morphology and Reliability","authors":"Hanmin Lee, Seyong Lee, Sangmyung Shin, Taejin Choi, SooIn Park, K. Paik","doi":"10.1109/ECTC.2019.000-5","DOIUrl":null,"url":null,"abstract":"In this study, solder bump flip chip assembly using NCFs was evaluated for Sn-Ag solder bumps. Flip chip bonding was performed using an isothermal Thermo-Compression (TC) bonding method for 5 seconds. Solder bump joints were evaluated by adjusting the curing properties such as curing onset, peak temperature, and degree of curing and viscosities of NCFs using curing agents and silica contents. And then, the degree of cure and viscosity approximations were conducted to define the precise viscosity of NCFs at the solder melting temperature using measured degree of cures at various bonding temperatures and viscosities. Finally, high temperature and humidity test (85RH%/85°C test) and temperature cycling (T/C) test were performed to evaluate the thermo-mechanical reliability performance depending on solder joint.","PeriodicalId":6726,"journal":{"name":"2019 IEEE 69th Electronic Components and Technology Conference (ECTC)","volume":"45 1","pages":"2278-2283"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 69th Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2019.000-5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

In this study, solder bump flip chip assembly using NCFs was evaluated for Sn-Ag solder bumps. Flip chip bonding was performed using an isothermal Thermo-Compression (TC) bonding method for 5 seconds. Solder bump joints were evaluated by adjusting the curing properties such as curing onset, peak temperature, and degree of curing and viscosities of NCFs using curing agents and silica contents. And then, the degree of cure and viscosity approximations were conducted to define the precise viscosity of NCFs at the solder melting temperature using measured degree of cures at various bonding temperatures and viscosities. Finally, high temperature and humidity test (85RH%/85°C test) and temperature cycling (T/C) test were performed to evaluate the thermo-mechanical reliability performance depending on solder joint.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
非导电膜(nfc)的固化性能和粘度对锡银凸点形貌和可靠性的影响
在这项研究中,使用nfc对锡银焊料凸点进行了评估。采用等温热压缩(TC)键合方法进行倒装芯片键合5秒。通过使用固化剂和二氧化硅含量来调整凹凸焊点的固化性能,如固化起始时间、峰值温度、nfc的固化程度和粘度。然后,利用不同焊接温度和黏度下的固化度测量值,对nfc在焊料熔化温度下的精确黏度进行了近似固化和黏度计算。最后,通过高温高湿试验(85 rh %/85℃试验)和温度循环试验(T/C)对不同焊点的热-机械可靠性性能进行了评价。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Further Enhancement of Thermal Conductivity through Optimal Uses of h-BN Fillers in Polymer-Based Thermal Interface Material for Power Electronics A Novel Design of a Bandwidth Enhanced Dual-Band Impedance Matching Network with Coupled Line Wave Slowing A New Development of Direct Bonding to Aluminum and Nickel Surfaces by Silver Sintering in air Atmosphere Signal Integrity of Submicron InFO Heterogeneous Integration for High Performance Computing Applications Multilayer Glass Substrate with High Density Via Structure for All Inorganic Multi-chip Module
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1