Advanced flexible CMOS integrated circuits on plastic enabled by controlled spalling technology

D. Shahrjerdi, S. Bedell, A. Khakifirooz, K. Fogel, P. Lauro, K. Cheng, J. Ott, M. Gaynes, D. Sadana
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引用次数: 25

Abstract

We present, for the first time, mechanically-flexible advanced-node CMOS circuits, including SRAM and ring oscillators, with gate lengths <;30 nm and contacted gate pitch of 100 nm. Our novel layer transfer technique called “controlled spalling” is employed as an incredibly simple, low-cost, and manufacturable approach to separate the finished CMOS circuits from the host silicon substrate. The overall performance of the flexible devices and circuits are carefully examined, demonstrating functional SRAM cells down to VDD=0.6V and ring oscillators with record stage delay of ~16ps, the best reported to date for a flexible circuit.
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先进的柔性CMOS集成电路在塑料上实现控制剥落技术
我们首次提出了机械柔性的先进节点CMOS电路,包括SRAM和环形振荡器,其栅极长度< 30 nm,接触栅极间距为100 nm。我们的新层转移技术称为“控制剥落”,是一种非常简单、低成本和可制造的方法,可以将成品CMOS电路与主硅衬底分离。仔细检查了柔性器件和电路的整体性能,展示了功能SRAM单元低至VDD=0.6V和环形振荡器,其记录级延迟为~16ps,这是迄今为止柔性电路中最好的。
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