{"title":"故障覆盖分析的统计模型","authors":"C. Chen, N. Soong","doi":"10.1109/VTEST.1991.208163","DOIUrl":null,"url":null,"abstract":"The authors present a statistical model for the evaluation of test coverage for both single-stuck-at and multiple-stuck-at faults. The model parameters are the node fault complexity and test frequency. For multiple fault detection, the model is applied to calculate the defect level of a production test.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"1099 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A statistical model for fault coverage analysis\",\"authors\":\"C. Chen, N. Soong\",\"doi\":\"10.1109/VTEST.1991.208163\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a statistical model for the evaluation of test coverage for both single-stuck-at and multiple-stuck-at faults. The model parameters are the node fault complexity and test frequency. For multiple fault detection, the model is applied to calculate the defect level of a production test.<<ETX>>\",\"PeriodicalId\":157539,\"journal\":{\"name\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"volume\":\"1099 \",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1991.208163\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208163","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors present a statistical model for the evaluation of test coverage for both single-stuck-at and multiple-stuck-at faults. The model parameters are the node fault complexity and test frequency. For multiple fault detection, the model is applied to calculate the defect level of a production test.<>
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