模拟VLSI的电流模式技术:技术和缺陷容限问题

[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems Pub Date : 1991-11-18 DOI:10.1109/DFTVS.1991.199942

A. Andreou

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引用次数: 2

摘要

未来的大规模模拟计算系统将不得不应对制造缺陷和单个组件的不匹配。作者认为，电流模式设计技术，特别是晶体管级的最小设计与未来晶圆级模拟系统的制造要求是一致的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Current-mode techniques for analog VLSI: technology and defect tolerance issues

Future large scale analog computational systems will have to cope with manufacturing defects and mismatch in individual components. The author argues that current-mode design techniques, and in particular minimal designs at the transistor level are consistent with future manufacturing requirements for wafer scale analog systems.<>

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[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems

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