系统级表征、建模和瞬态故障脆弱性的概率形式化分析

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328702

Ghaith Bany Hamad, Marwan Ammar, O. Mohamed, Y. Savaria

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摘要

本文提出了一种连续时间马尔可夫链模型，分析和估计了单事件扰动(SEUs)对LEON3过程的脆弱性。在系统级，所提出的技术提供了对SEU传播概率和延迟的新见解。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults

This paper presents a continuous-time Markov chain modeling, analysis, and estimation of the LEON3 proces-sor‘s vulnerability to Single Event Upsets (SEUs). At the system-level, the proposed technique provides new insights into SEU propagation probabilities and latency.

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2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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