耦合量子阱中的电子隧穿时间

D. Oberli, J. Shah, T. Damen, C. Tu, D. A. Miller
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引用次数: 0

摘要

Esaki和Tsu对超晶格隧道效应的研究引起了人们对隧道效应在实际器件中的潜在应用的极大兴趣。外延生长技术的快速发展导致了具有量子尺寸效应和隧道效应的新型半导体结构的产生,如双势垒共振隧道结构或超晶格p-i-n二极管2。在这些结构中的输运研究证明了通过超晶格微带的Bloch输运,双势垒二极管的负差分电阻,场诱导定位。最近,在双势垒结构中进行了光学测量,以便对空间电荷的积累和逃逸率有一些了解。
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Electron Tunneling Times in Coupled Quantum Wells
The work by Esaki and Tsu on tunneling in superlattices1 has generated a considerable interest for the potential application of tunneling to real devices. The rapid progress of epitaxial growth techniques has led to the creation of novel semiconductor structures which exhibit quantum-size effects and tunneling such as the double-barrier resonnant tunneling structures or the superlattice p-i-n diodes2. Transport studies in these structures demonstrated Bloch transport through the superlattice minibands3, negative differential resistance in double barrier diodes4, field induced localization5. More recently, optical measurements have been performed in double barrier structures in order to gain some insight on space-charge buildup6 and escape rates7.
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